Effective Surface Recombination of p+ Layers Doped Using Ion Implantation or Surface Deposited B Sources

On effective surface recombination parameters

The microstructure of Si surface layers after plasma-immersion He+ ion implantation and subsequent thermal annealing1

The structural changes in the surface layer of p-type Cz-Si(001) samples after high-dose low-energy (2 keV) He+ plasma-immersion ion implantation and subsequent thermal annealing were studied using a set of complementary methods: high-resolution X-ray reflectometry, high-resolution X-ray diffraction, transmission electron microscopy and atomic force microscopy. The formation of a three-layer st...

Surface plasmon enhanced emission from dye doped polymer layers.

We have experimentally verified that the emission of visible light from dye doped polymers can be enhanced with the use of surface plasmon coupling. By matching the plasmon frequency of a thin unpatterned silver film to the emission of a dye doped polymer deposited onto this metal surface, we have observed a eleven-fold enhancement of light emission. By patterning the silver layer, we estimate ...

Control of Doped Layers in P-i-n Microcrystalline Solar Cells Fully Deposited with Hwcvd

In this paper, the influence of the deposition conditions on the performance of p-i-n microcrystalline silicon solar cells completely deposited by Hot-Wire Chemical Vapour Deposition is studied. With this aim, the role of the doping concentration, the substrate temperature of the p-type layer and of amorphous silicon buffer layers between the p/i and i/n microcrystalline layers is investigated....

Nuclear reaction analysis with ion microbeam of cross sections of surface layers deposited in a tokamak divertor

Ion micro beam analysis has been applied to the investigation of plasma deposited layers covering the divertor tiles in the JET tokamak. Since the layers are about 100 lm thick they are too thick to be completely investigated by ordinary ion beam analysis. Cross sections of the layers were prepared by cutting and polishing. Elemental depth profiles were determined from the two dimensional image...